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2 edition of Selected papers on interference, interferometry, and interferometric metrology found in the catalog.

Selected papers on interference, interferometry, and interferometric metrology

Selected papers on interference, interferometry, and interferometric metrology

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  • 15 Currently reading

Published by SPIE Optical Engineering Press in Bellingham, Wash .
Written in English


Edition Notes

Includes bibliographical references and indexes.

Other titlesInterference, interferometry, and interferometric metrology
Statementeditors, P. Hariharan, Daniel Malacara.
SeriesSPIE milestone series ;, v. MS 110
ContributionsHariharan, P., Malacara, Daniel, 1937-
Classifications
LC ClassificationsQC411 .S44 1955
The Physical Object
Paginationxv, 701 p. :
Number of Pages701
ID Numbers
Open LibraryOL784607M
ISBN 100819419362
LC Control Number95016763

Interferometric and holographic measuring technology makes it possible to measure geometrical forms precisely, at sub-micrometer accuracy. In this process, differences in the paths of the measuring and reference beams in the wavelength range are compared with one . A “virtual-interferometer” technique for surface metrology Scott M. Jobling1,* and Paul G. Kwiat2 1Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, W Green Street, Urbana, IL , USA 2Department of Physics, University of Illinois at Urbana-Champaign, W Green Street, Urbana, IL , USACited by: 1.

Recent developments in next generation disc technology, cameras in mobile phones, zoom-lenses for small digital cameras and camcorders, digital SLRs, and television cameras have amplified the demand for affordable optical systems with outstanding image quality, a combination that can only be achieved using aspheric surfaces. The metrology of aspheric surfaces is a classical problem, but Cited by: 2. DIRAC OPTICS: GENERALIZED QUANTUM INTERFERENCE EQUATION. PAPERS AND BOOK CHAPTERS. These are references on the optics derived from the application of Dirac's bra-ket notation to N-slit explained in the references Dirac's quantum approach is applicable to the propagation of a single photon or to the propagation of ensembles of indistinguishable photons.

Conditions on the factory floor and in industrial cleanrooms with high-capacity air filtration systems can hamper the use of interferometry. Another problem is the testing of large-aperture mirrors where it is difficult to mechanically isolate them and the structures needed to support the optical test; in addition, long optical paths produce air turbulence problems. James C. Wyant Page 1 Basic Interferometry and Optical Testing • Two Beam Interference • Fizeau Interferometer • Twyman-Green Interferometer • Laser Based Fizeau • Mach-Zehnder Interferometer • Typical Interferograms • Interferograms and Moiré Patterns • Classical techniques for inputting data into computer James C. Wyant Page 2 Two-Beam Interference FringesFile Size: 1MB.


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Selected papers on interference, interferometry, and interferometric metrology Download PDF EPUB FB2

Spie Press Book Selected Papers on Interference, Interferometry, and Interferometric Metrology. Editor(s): Parameswaran Hariharan; Daniel Malacara-Hernandez. Format Member Price Non-Member Price; Hardcover: $ $ Additional Physical Format: Online version: Selected papers on interference, interferometry, and interferometric metrology.

Bellingham, Wash.: SPIE Optical. Interferometry has been a time-honored technique for surface topography measurement. Interferometric measurements of surface shape are relative measurement techniques in which the shape of a known surface is compared with that of an unknown surface, and the difference is displayed as a series of interference fringes.

Noise attached in the interference fringes can have catastrophic effects on Author: Dahi Ghareab Abdelsalam, Baoli Yao. QPSI™ DynaPhase ® Interferometer Systems Interferometer systems from ZYGO were commercially introduced 47 years ago, and ZYGO continues to maintain leadership in surface form metrology using interferometry.

Interferometer systems by ZYGO were chosen o times through the years, and many of those interferometer systems continue to be relied on daily to provide accurate production. / Digital heterodyne interferometry, N. Massie (in Interferometric Metrology, Proc.

SPIE) / Sub-Nyquist interferometry, J. Greivenkamp (Applied Optics ) Section Thirteen. Does interferometry work. A critical look at the foundations of interferometric surface topography measurement A review of selected topics in interferometric optical metrology Applications of optical coherence in interferometric metrology Characterizing the resolving power of laser Fizeau interferometers Optical metrology for immersive display components and subsystems Show All 54 Items Show.

Interferometry is a family of techniques in which waves, usually electromagnetic waves, are superimposed, causing the phenomenon of interference, which is used to extract information. Interferometry is an important investigative technique in the fields of astronomy, fiber optics, engineering metrology, optical metrology, oceanography, seismology, spectroscopy (and its applications to.

Interferometry: Measuring with Light Long applied to optical shop testing, interferometry is now used to measure many different types of parts in a variety of applications, such as optical system performance, surface roughness, surface form, and displacement of moving surfaces.

UNIT 9 INTERFEROMETRY Interferometry Structure Introduction Objectives Interference of Light Light Sources for Interferometry Interferometry Applied to Flatness Testing Interferometry in Testing of Surface Contour and Measurement of Height Interferometers Laser Interferometers Summary Key WordsFile Size: KB.

When the first edition of Optical Interferometry was published, interferometry was regarded as a rather esoteric method of making measurements, largely confined to the laboratory.

Today, however, besides its use in several fields of research, it has applications in fields as diverse as measurement of length and velocity, sensors for rotation, acceleration, vibration and electrical and magnetic 5/5(1).

The extension of multi-telescope interferometry and aperture synthesis to infrared and optical wavelengths will enable in this decade significant progress in stellar and galactic physics, and will lead to great interferometric infrared/optical arrays of the future.

The real-time correction of. Micro-optics metrology using advanced interferometry Stephan Reichelt*, Alexander Bieber, Bernd Aatz, and Hans Zappe Laboratory for Micro-optics, Institute of Microsystem Technology (IMTEK).

BASICS OF INTERFEROMETRY. 2 CCD. Interferometer. 4 Typical Interferometer Interference Filters all but the red light from white light of halogen lamp Sample. 18 Michelson Interferometer X, X, 5X small divergence of beam long working distance Microscope Objective Sample.

Interferometers are normally operated in environment-controlled optical laboratories because vibrations will induce errors in measurement results. In order to extend the application of interferometry to shop floor inspection, two methods are adapted: one method is to introduce a reference interferometer and vibration compensation system to the main interferometer, to compensate for the Cited by: 1.

This talk is titled "Advances in Interferometric Metrology" by James C. Wyant from the University of Arizona. Date of presentation was Ap Laser Interferometry - Duration:   Interferometric metrology has also played an important role in fundamental research into the physical universe.

The Michelson–Morley experiment using the interferometer of figure 3 was a watershed test of the electromagnetic theory at the time, using the extraordinary sensitivity of interferometry in an attempt to confirm the existence Cited by: 5.

For the last several years the common capacitive tools for wafer dimensional metrology have been replaced by interferometric tools with higher sensitivity and resolution.

In the interferometric tools the front and back surface figure of the wafer is measured simultaneously while the wafer is Cited by: metrology Lasers are also being increasingly used in interferometers The phenomenon of interference is made use of for carrying out precise measurements of very small linear dimensions, and the measurement technique is popularly known as interferometry.

This technique is used in a variety of metrological applications File Size: 1MB. Two-wavelength holography and phase-shifting interferometry are combined to measure the phase contours of deep wavefronts and surfaces, such as those produced by aspherics, with a variable sensitivity.

When interference fringes are very closely spaced, the phase data contain high frequencies where 2p ambiguities cannot be resolved. Interferometry. The design and use of optical interferometers. Optical interferometers based on both two-beam interference and multiple-beam interference of light are extremely po.

Interferometry with broadband light: Applications in Metrology for a particular value of z and d, where σ c and ∆σ are the central wave number and the bandwidth of the white light source.Principles and Theory of Radar Interferometry Septem IGARSS 04 Tutorials Paul A Rosen Jet Propulsion Laboratory IEEE is an Authorized CEU Provider of the International Association for Continuing Education and Training.

IACET Provider #  Interferometry is a powerful tool often used for the metrology of surfaces with many applications in industries such as optical fabrication, data storage, machine tool, and semiconductor. For many years interferometers have been built into microscopes so Author: James C.

Wyant.